| Manufacturer Part Number: | PMN15UN,115 | 
|---|---|
| Manufacturer: | NXP Semiconductors | 
| Product Category: | Transistors - FETs, MOSFETs - Single | 
| Available Quantity: | 9010 Pieces | 
| Unit Price: | Quote by Email | 
| Description: | MOSFET N-CH 30V 8A SC-74 | 
| Lead Free Status / RoHS Status: | Lead free / RoHS Compliant | 
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) | 
| Production Status (Lifecycle): | Obsolete / Discontinued | 
| Delivery Time: | 1-2 Days | 
| Date Code (D/C): | New | 
| Datasheet Download: | PMN15UN,115 Datasheet | 
| Internal Part Number | 898-PMN15UN,115 | |
| Manufacturer Lead time | 6-8 weeks | |
| Condition | New & Unused, Original Sealed | |
| PCN Obsolescence/ EOL | Multiple Devices 25/Dec/2013 | |
| Category | Discrete Semiconductor Products | |
| Family | Transistors - FETs, MOSFETs - Single | |
| Manufacturer | NXP Semiconductors | |
| Series | - | |
| Packaging | Tape & Reel (TR) | |
| Part Status | Obsolete | |
| FET Type | MOSFET N-Channel, Metal Oxide | |
| FET Feature | Standard | |
| Drain to Source Voltage (Vdss) | 30V | |
| Current - Continuous Drain (Id) @ 25°C | 8A (Tc) | |
| Rds On (Max) @ Id, Vgs | - | |
| Vgs(th) (Max) @ Id | - | |
| Gate Charge (Qg) @ Vgs | - | |
| Input Capacitance (Ciss) @ Vds | - | |
| Power - Max | - | |
| Operating Temperature | - | |
| Mounting Type | Surface Mount | |
| Package / Case | SC-74, SOT-457 | |
| Supplier Device Package | 6-TSOP | |
| Standard Package | 3,000 | |
| Weight | 0.001 KG | |
| Application | Email for details | |
| Replacement Part | PMN15UN,115 | |
| Country of Origin | USA / JAPAN / Philippines / Malaysia | |
| MOQ | 1 Piece | |
| Picture / Image / Photo | Send via email | |
PMN15UN,115 is in stock for immediate shipping now. We are the distributor of NXP Semiconductors all series components. The condition of PMN15UN,115 is new and unused, you can buy PMN15UN,115 NXP Semiconductors with us at a very low price and quick delivery. 
Please kindly send us an email if you have any demands for PMN15UN,115.
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