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| Manufacturer Part Number: | HCF4011BEY |
|---|---|
| Manufacturer: | STMicroelectronics |
| Product Category: | Logic - Gates and Inverters |
| Available Quantity: | 9010 Pieces |
| Unit Price: | Quote by Email |
| Description: | NAND Gate IC 4 Channel 14-DIP |
| Lead Free Status / RoHS Status: | Lead free / RoHS Compliant |
| Moisture Sensitivity Level (MSL): | 1 (Unlimited) |
| Production Status (Lifecycle): | Obsolete / Discontinued |
| Delivery Time: | 1-2 Days |
| Date Code (D/C): | New |
| Datasheet Download: | HCF4011BEY Datasheet |
| Internal Part Number | 898-HCF4011BEY | |
| Manufacturer Lead time | 6-8 weeks | |
| Condition | New & Unused, Original Sealed | |
| EDA / CAD Models | Download from Accelerated Designs | |
| Category | Integrated Circuits (ICs) | |
| Family | Logic - Gates and Inverters | |
| Manufacturer | STMicroelectronics | |
| Series | 4000B | |
| Packaging | Tube | |
| Part Status | Obsolete | |
| Logic Type | NAND Gate | |
| Number of Circuits | 4 | |
| Number of Inputs | 2 | |
| Features | - | |
| Voltage - Supply | 3 V ~ 20 V | |
| Current - Quiescent (Max) | 5µA | |
| Current - Output High, Low | 6.8mA, 6.8mA | |
| Logic Level - Low | 1.5 V ~ 4 V | |
| Logic Level - High | 3.5 V ~ 11 V | |
| Max Propagation Delay @ V, Max CL | 90ns @ 15V, 50pF | |
| Operating Temperature | -55°C ~ 125°C | |
| Mounting Type | Through Hole | |
| Supplier Device Package | 14-DIP | |
| Package / Case | 14-DIP (0.300", 7.62mm) | |
| Standard Package | 25 | |
| Weight | 0.001 KG | |
| Application | Email for details | |
| Replacement Part | HCF4011BEY | |
| Country of Origin | USA / JAPAN / Philippines / Malaysia | |
| MOQ | 1 Piece | |
| Picture / Image / Photo | Send via email | |
HCF4011BEY is in stock for immediate shipping now. We are the distributor of STMicroelectronics all series components. The condition of HCF4011BEY is new and unused, you can buy HCF4011BEY STMicroelectronics with us at a very low price and quick delivery.
Please kindly send us an email if you have any demands for HCF4011BEY.
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